Marvin Test Solutions: MV-GX5292e: PXIe Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100

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  • MV-GX5292E
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Model Marvin Test Solutions: MV-GX5292e
PXIe Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100 MHz w/256MB Memory & LVDS

  • 32 input / output channels
  • dynamically configurable on a per channel basis
  • 256 MB of on-board vector memory
  • Supports 1.5 V, 1.8 V, 2.5 V, 3.3 V, and 5 V TTL/LVTTL interfaces
  • Supports LVDS, M-LVDS, LVDM interfaces
  • 100 MHz vector rate
  • Stimulus / Response & Real-Time Compare modes
  • Operates as a stand-alone card or with up to seven additional synchronous slave boards

The Marvin Test MV-GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The MV-GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

Features

The MV-GX5292e supports selectable I/O levels of 1.5 V, 1.8 V, 2.5 V, or 3.3 V (TTL, LVTTL, CMOS, LVCMOS). In addition, the MV-GX5292e supports 32 differential channels for LVDS, M-LVDS, or LVDM logic families. The TTL / LVTTL interface utilizes a programmable voltage source, which sets the output logic levels from 1.4 V to 3.6 V. Programmable thresholds of 1.5 V, 1.8 V, 2.5 V or 3.3 V (5 V compatible) are supported for input signals. Recommended operating input voltage range is from 0 V to 5.5 V.

A windowing method is utilized for PCI memory accesses, which limits the required PCI memory space for each board to only 16 MB, thus preserving test system resources. A direct mode, for continuous data transfer between the test system controller and the I/O pins of the Marvin Test MV-GX5292e is also supported.

The MV-GX5292e offers 256 Mb of vector memory, with 64 Mb per channel. Programmable I/O width allows trading vector width for vector depth. Under software control, the MV-GX5292e's vector memory can be configured to support channel widths of 32, 16, 8, 4, 2 and 1 with corresponding vector depths of 64 Mb, 128 Mb, 256 Mb, 512 Mb, 1024 Mb, and 2048 Mb per channel.

The Marvin Test MV-GX5292e provides programmable TTL/LVTTL output clocks and strobes, and supports external clock and strobe. A programmable PLL (phase locked loop) provides configurable clock frequencies and delays. An LVDS input and output clock is also provided.

The MV-GX5292e's sequencer can halt or pause on a defined address or loop through the entire memory as well as loop on a defined address range or through a defined block of memory, address range or through a defined block of memory. Two modes digital test are also supported - a Stimulus / Response and a RealTime Compare mode. The Stimulus / Response mode is used for driving and capturing data. Alternatively, for digital tests requiring long test vectors, the Real-Time Compare mode can be used to significantly shorten overall test times by comparing in real-time, expected test results and logging only failed vectors and resultant test results (pass or fail).

Scope of Delivery:

  • Marvin Test Solutions MV-GX5292e: PXIe Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100 MHz w/256MB Memory & LVDS
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