MV-GX1120
- Order number: MV-GX1120
Model Marvin Test Solutions: MV-GX1120
250 MS/s, 2-Channel, Arbitrary Waveform Function Generator PXI Card
- Arbitrary Waveform Generator modes
- Direct Digital Synthesis modes
- 250 MS/s sample rate per channel
- 400 MS/s sample rate combined channel mode
- 16-bit vertical resolution
- 32 M sample memory
- PLL clock generator for AWG mode
The Marvin Test MV-GX1120 is a high performance, two-channel PXI arbitrary waveform generator that offers function generator and arbitrary waveform generator functionality within one instrument. Built-in waveforms are available for use with both the DDS or AWG modes of operation and include Sine, Triangle, Ramp, Noise, and pulse waveform generation.
Features
With a sample rate of 250 MS/s for each channel and with the ability for the two channels to operate synchronously and phase coherently, the Marvin Test MV-GX1120 is an ideal I/Q modulation source for communication applications, troubleshooting encoding schemes, and verifying modulator performance. Additionally, the MV-GX1120’s two channels can be combined to produce 400 MS/s arbitrary waveforms with 16 bits of vertical resolution – offering an extremely high performance, high resolution waveform generator in a compact, 3U form factor. Each channel is fully independent and offers programming of the channel’s sample clock, output level, waveform and offset settings. The MV-GX1120 comes standard with 32 M samples of waveform memory.
Triggering
The Marvin Test MV-GX1120 can be triggered via a software command, a PXI trigger event, or an external trigger input, offering users the ability to control waveform generation via external trigger events. The waveform trigger modes include continuous, triggered, gated hold, and burst functionality.
Sample Clock
An internal 50 MHz clock reference is used to create the 250 MHz clock for DDS mode. For Arb mode, two independent PLLs are used to drive each arbitrary waveform generator with a maximum sample rate of 250 MHz. The PLLs can use the internal 50 MHz reference or they can be locked to the PXI 10 MHz clock. The sample clock can generate sample frequencies with 4 digits of resolution or 10 ps of resolution.
Scope of Delivery:
- Marvin Test Solutions MV-GX1120: Arbitrary Waveform Function Generator PXI Card
- Manual
- Certificate of Calibration
Marvin Test Solutions ist ein amerikanischer Hersteller für PXI Instrumente und Software für Funktionstestsysteme und Halbleitertest.
- Eine besondere Stärke von Marvin Test Solutions sind schnelle digitale Pattern-I/O Karten, FPGA- und SMU Karten im 3U und 6U PXI Formfaktor.
- Neben Einzelkomponenten liefert Marvin auch vorkonfigurierte Funktionstestsysteme und Halbleitertestsysteme.
- Mit der ATEasy Entwicklungsumgebung bietet Marvin Kunden, die eine eigene Testsoftware-Architektur realisieren wollen, einen leistungsfähigen Baukasten inkl. integrierter Sequenzerfunktionen.
LXinstruments vertreibt Produkte von Marvin Test Solutions in Deutschland, Österreich und der Schweiz.
